TY - JOUR
T1 - Preparation and thermoelectric properties of mixed valence compound Sn2S3
AU - Saito, Wataru
AU - Hayashi, Kei
AU - Nagai, Hiroki
AU - Miyazaki, Yuzuru
N1 - Publisher Copyright:
© 2017 The Japan Society of Applied Physics.
PY - 2017/6
Y1 - 2017/6
N2 - The preparation and thermoelectric properties of Sn2S3 polycrystalline samples were reported. An almost single-phase Sn2S3 polycrystalline sample was obtained by heating Sn and S mixed powders: the sample was successfully densified using a spark-plasma-sintering method. Sn2S3 building blocks with electron lone pairs were weakly bonded via van der Waals force. Similar to other compounds with electron lone pairs, a thermal conductivity lower than 1.4W&m%1&K%1 was obtained for the Sn2S3 sample from 298 to 701 K. Although the Sn2S3 sample exhibited a high absolute value of Seebeck coefficient, its electrical conductivity was considerably low, leading to a low dimensionless figure of merit, zT, of 9.6 ' 10%4 at 700 K. The poor electrical transport properties indicated that the Sn2S3 sample was a semiconductor with an extremely low carrier density, which was confirmed by measurements of its band gap and by calculations of the temperature dependence of Seebeck coefficient.
AB - The preparation and thermoelectric properties of Sn2S3 polycrystalline samples were reported. An almost single-phase Sn2S3 polycrystalline sample was obtained by heating Sn and S mixed powders: the sample was successfully densified using a spark-plasma-sintering method. Sn2S3 building blocks with electron lone pairs were weakly bonded via van der Waals force. Similar to other compounds with electron lone pairs, a thermal conductivity lower than 1.4W&m%1&K%1 was obtained for the Sn2S3 sample from 298 to 701 K. Although the Sn2S3 sample exhibited a high absolute value of Seebeck coefficient, its electrical conductivity was considerably low, leading to a low dimensionless figure of merit, zT, of 9.6 ' 10%4 at 700 K. The poor electrical transport properties indicated that the Sn2S3 sample was a semiconductor with an extremely low carrier density, which was confirmed by measurements of its band gap and by calculations of the temperature dependence of Seebeck coefficient.
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U2 - 10.7567/JJAP.56.061201
DO - 10.7567/JJAP.56.061201
M3 - Article
AN - SCOPUS:85020171322
SN - 0021-4922
VL - 56
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 6
M1 - 061201
ER -