Abstract
We show that there can be a contamination of silica particles on the surface of chemo-mechanically polished ZnO substrates. Consideration of the base of electrochemistry led us to a hypothesis that the alkaline polishing solution produces a layer of Zn(OH)2 capturing silica particles. In-situ observation of the etching process in an acidic solution by means of an atomic force microscope as well as zeta potential measurements supports this hypothesis and gives a clear guidance to solve the problem. We find that an epitaxy-ready surface can be reproducibly prepared by dipping ZnO substrates in an HCl solution (HCl : H2O = 7 : 200) for 30 s.
Original language | English |
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Article number | 035701 |
Journal | Applied Physics Express |
Volume | 4 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2011 Mar |