Preparation of tin modified silica mesoporous film

Tin modified silica mesoporous films have been prepared by direct synthesis for the first time. The films were synthesized using cetyltrimethylammonium chloride as structure-directing agents and deposited on glass substrates by spin coating and finally calcined at 400° C. Characterization including small axis x-ray diffraction patterns, nitrogen absorption desorption and atomic force microscope were observed. The resulting films with the Sn/Si ratios of 0.005-0.03 have shown to maintain mesoporous structure after calcinations. The pore size uniformity was confirmed by the nitrogen absorption desorption isotherm although the hexagonal pore arrangements were disordered as the increasing amount of tin loaded into the solution. This novel tin modified silica mesoporous film has promising application in catalyst as well as sensor devices.