Present state of TEM-SXES analysis and its application to SEM aiming chemical analysis of bulk materials

M. Terauchi, H. Takahashi, N. Handa, T. Murano, M. Koike, T. Imazono, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto

    Research output: Contribution to journalConference articlepeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Pages (from-to)682-683
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume20
    Issue number3
    DOIs
    Publication statusPublished - 2014 Aug 1
    EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
    Duration: 2014 Aug 32014 Aug 7

    ASJC Scopus subject areas

    • Instrumentation

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