Profile measurement of micro-aspheric surface by a small-scale measuring instrument

Atsushi Shibuya; Yoshikazu Arai; Yasuo Yoshikawa; Wei Gao

Profile measurement of micro-aspheric surface by a small-scale measuring instrument

Atsushi Shibuya, Yoshikazu Arai, Yasuo Yoshikawa, Wei Gao

ENG - Finemechanics

Tohoku University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE
Publication status	Published - 2008
Event	23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE - Portland, OR, United States Duration: 2008 Oct 19 → 2008 Oct 24

Publication series

Name	Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

Conference

Conference	23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE
Country/Territory	United States
City	Portland, OR
Period	08/10/19 → 08/10/24

Cite this

Shibuya, A., Arai, Y., Yoshikawa, Y., & Gao, W. (2008). Profile measurement of micro-aspheric surface by a small-scale measuring instrument. In Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE (Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE).

Shibuya, Atsushi ; Arai, Yoshikazu ; Yoshikawa, Yasuo et al. / Profile measurement of micro-aspheric surface by a small-scale measuring instrument. Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE. 2008. (Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE).

@inproceedings{6daf3b2d94b24659bedc693579b762d0,

title = "Profile measurement of micro-aspheric surface by a small-scale measuring instrument",

author = "Atsushi Shibuya and Yoshikazu Arai and Yasuo Yoshikawa and Wei Gao",

year = "2008",

language = "English",

isbn = "9781887706483",

series = "Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE",

booktitle = "Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE",

note = "23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE ; Conference date: 19-10-2008 Through 24-10-2008",

}

Shibuya, A, Arai, Y, Yoshikawa, Y & Gao, W 2008, Profile measurement of micro-aspheric surface by a small-scale measuring instrument. in Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE. Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE, 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE, Portland, OR, United States, 08/10/19.

Profile measurement of micro-aspheric surface by a small-scale measuring instrument. / Shibuya, Atsushi; Arai, Yoshikazu; Yoshikawa, Yasuo et al.
Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE. 2008. (Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Profile measurement of micro-aspheric surface by a small-scale measuring instrument

AU - Shibuya, Atsushi

AU - Arai, Yoshikazu

AU - Yoshikawa, Yasuo

AU - Gao, Wei

PY - 2008

Y1 - 2008

UR - http://www.scopus.com/inward/record.url?scp=84884926305&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84884926305&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84884926305

SN - 9781887706483

T3 - Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

BT - Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

T2 - 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

Y2 - 19 October 2008 through 24 October 2008

ER -

Shibuya A, Arai Y, Yoshikawa Y, Gao W. Profile measurement of micro-aspheric surface by a small-scale measuring instrument. In Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE. 2008. (Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE).

Profile measurement of micro-aspheric surface by a small-scale measuring instrument

Publication series

Conference

Other files and links

Cite this