TY - JOUR
T1 - Properties of nanostructured and amorphous films in the TiB 2-B4C system
AU - Kalinnikov, G. V.
AU - Andrievski, R. A.
AU - Kopylov, V. N.
AU - Louzguine, D.
N1 - Funding Information:
This study was supported by the Presidium of the Russian Academy of Sciences (project no. P-9) and the Russian Foundation for Basic Research (project nos. 05-03-32248 and 06-03-90566).
PY - 2008/2
Y1 - 2008/2
N2 - Nanostructured and x-ray-amorphous films in the TiB2-B 4C system are prepared by nonreactive magnetron sputtering in the absence and presence of an additional external magnetic field with inductions of up to 0.3 T. The properties of the deposited films, such as the grain size, phase composition, dominant texture, roughness, and hardness, are investigated using transmission electron microscopy, microdiffraction, x-ray powder diffraction, atomic force microscopy, and microdurometry. The specific features of the phase diagram as applied to films and the effect of application of the magnetic field on their properties are discussed.
AB - Nanostructured and x-ray-amorphous films in the TiB2-B 4C system are prepared by nonreactive magnetron sputtering in the absence and presence of an additional external magnetic field with inductions of up to 0.3 T. The properties of the deposited films, such as the grain size, phase composition, dominant texture, roughness, and hardness, are investigated using transmission electron microscopy, microdiffraction, x-ray powder diffraction, atomic force microscopy, and microdurometry. The specific features of the phase diagram as applied to films and the effect of application of the magnetic field on their properties are discussed.
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U2 - 10.1134/s106378340802025x
DO - 10.1134/s106378340802025x
M3 - Article
AN - SCOPUS:40549088250
SN - 1063-7834
VL - 50
SP - 374
EP - 378
JO - Physics of the Solid State
JF - Physics of the Solid State
IS - 2
ER -