Quantitative electron holographic analysis of electric potential distribution around FEG-emitters

J. J. Kim; W. X. Xia; D. Shindo; T. Oikawa; T. Tomita

doi:10.2320/matertrans.MD200719

Quantitative electron holographic analysis of electric potential distribution around FEG-emitters

J. J. Kim, W. X. Xia, D. Shindo, T. Oikawa, T. Tomita

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

By means of electron holography, the electric potential distributions around a cold-type FEG-emitter (field emission gun emitter) are visualized with a change in the applied voltages. In a biased FEG-emitter, the experimental method for obtaining an unperturbed reference wave is applied in order to carry out quantitative electron holographic analyses. Further, through comparing the experimental results obtained by electron holography with those of the simulations taking into account the three dimensional configurations of the FEG-emitter and the anode, it is found that the experimental technique presented in this study is quite useful in obtaining the quantitative information regarding the electric field distribution around a biased FEG-emitter.

Original language	English
Pages (from-to)	2631-2635
Number of pages	5
Journal	Materials Transactions
Volume	48
Issue number	10
DOIs	https://doi.org/10.2320/matertrans.MD200719
Publication status	Published - 2007 Oct
Externally published	Yes

Keywords

Electric field
Electron holography
Field emission gun (FEG)-emitter

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.2320/matertrans.MD200719

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title = "Quantitative electron holographic analysis of electric potential distribution around FEG-emitters",

abstract = "By means of electron holography, the electric potential distributions around a cold-type FEG-emitter (field emission gun emitter) are visualized with a change in the applied voltages. In a biased FEG-emitter, the experimental method for obtaining an unperturbed reference wave is applied in order to carry out quantitative electron holographic analyses. Further, through comparing the experimental results obtained by electron holography with those of the simulations taking into account the three dimensional configurations of the FEG-emitter and the anode, it is found that the experimental technique presented in this study is quite useful in obtaining the quantitative information regarding the electric field distribution around a biased FEG-emitter.",

keywords = "Electric field, Electron holography, Field emission gun (FEG)-emitter",

author = "Kim, {J. J.} and Xia, {W. X.} and D. Shindo and T. Oikawa and T. Tomita",

year = "2007",

month = oct,

doi = "10.2320/matertrans.MD200719",

language = "English",

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T1 - Quantitative electron holographic analysis of electric potential distribution around FEG-emitters

AU - Kim, J. J.

AU - Xia, W. X.

AU - Shindo, D.

AU - Oikawa, T.

AU - Tomita, T.

PY - 2007/10

Y1 - 2007/10

N2 - By means of electron holography, the electric potential distributions around a cold-type FEG-emitter (field emission gun emitter) are visualized with a change in the applied voltages. In a biased FEG-emitter, the experimental method for obtaining an unperturbed reference wave is applied in order to carry out quantitative electron holographic analyses. Further, through comparing the experimental results obtained by electron holography with those of the simulations taking into account the three dimensional configurations of the FEG-emitter and the anode, it is found that the experimental technique presented in this study is quite useful in obtaining the quantitative information regarding the electric field distribution around a biased FEG-emitter.

AB - By means of electron holography, the electric potential distributions around a cold-type FEG-emitter (field emission gun emitter) are visualized with a change in the applied voltages. In a biased FEG-emitter, the experimental method for obtaining an unperturbed reference wave is applied in order to carry out quantitative electron holographic analyses. Further, through comparing the experimental results obtained by electron holography with those of the simulations taking into account the three dimensional configurations of the FEG-emitter and the anode, it is found that the experimental technique presented in this study is quite useful in obtaining the quantitative information regarding the electric field distribution around a biased FEG-emitter.

KW - Electric field

KW - Electron holography

KW - Field emission gun (FEG)-emitter

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Quantitative electron holographic analysis of electric potential distribution around FEG-emitters

Abstract

Keywords

ASJC Scopus subject areas

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