TY - JOUR
T1 - Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy
AU - Cho, Yasuo
AU - Kazuta, Satoshi
AU - Ohara, Koya
AU - Odagawa, Hiroyuki
PY - 2000
Y1 - 2000
N2 - The theory for quantitative measurement of linear and nonlinear dielectric constants using scanning nonlinear dielectric microscopy is explained in this paper. Using this theory, quantitative measurements for linear and nonlinear dielectric constants of dielectric materials were performed successfully.
AB - The theory for quantitative measurement of linear and nonlinear dielectric constants using scanning nonlinear dielectric microscopy is explained in this paper. Using this theory, quantitative measurements for linear and nonlinear dielectric constants of dielectric materials were performed successfully.
KW - Linear dielectric constant
KW - Nonlinear dielectric constant
KW - Quantitative measurement
KW - Scanning nonlinear dielectric microscopy
UR - http://www.scopus.com/inward/record.url?scp=0033705738&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0033705738&partnerID=8YFLogxK
U2 - 10.1143/jjap.39.3086
DO - 10.1143/jjap.39.3086
M3 - Article
AN - SCOPUS:0033705738
SN - 0021-4922
VL - 39
SP - 3086
EP - 3089
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 5 B
ER -