TY - GEN
T1 - Quantum transport property in FETs with deterministically implanted single-arsenic ions using single-ion implantation
AU - Hori, M.
AU - Shinada, T.
AU - Guagliardo, F.
AU - Ferrari, G.
AU - Prati, E.
N1 - Copyright:
Copyright 2012 Elsevier B.V., All rights reserved.
PY - 2012
Y1 - 2012
N2 - We fabricated silicon transistors containing two and six arsenic ions implanted in one dimensional array along the channel by single-ion implantation method. The quantum transport was measured through the D 0 and D - states of the arsenic ions at low temperature. We observed two different quantum transport regimes from the individual donor regime to the intermediate doping regime in which Hubbard bands are formed in agreement with the theoretical models. These results indicate that our deterministic single-ion doping method is more effective and reliable for single-dopant transistor development and pave the way towards single atom electronics for extended CMOS applications [12].
AB - We fabricated silicon transistors containing two and six arsenic ions implanted in one dimensional array along the channel by single-ion implantation method. The quantum transport was measured through the D 0 and D - states of the arsenic ions at low temperature. We observed two different quantum transport regimes from the individual donor regime to the intermediate doping regime in which Hubbard bands are formed in agreement with the theoretical models. These results indicate that our deterministic single-ion doping method is more effective and reliable for single-dopant transistor development and pave the way towards single atom electronics for extended CMOS applications [12].
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U2 - 10.1109/SNW.2012.6243338
DO - 10.1109/SNW.2012.6243338
M3 - Conference contribution
AN - SCOPUS:84867211434
SN - 9781467309943
T3 - 2012 IEEE Silicon Nanoelectronics Workshop, SNW 2012
BT - 2012 IEEE Silicon Nanoelectronics Workshop, SNW 2012
T2 - 2012 17th IEEE Silicon Nanoelectronics Workshop, SNW 2012
Y2 - 10 June 2012 through 11 June 2012
ER -