Radiation imaging with a new scintillator and a CMOS camera

S. Kurosawa, Y. Shoji, J. Pejchal, Y. Yokota, A. Yoshikawa

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7 Citations (Scopus)


A new imaging system consisting of a high-sensitivity complementary metal-oxide semiconductor (CMOS) sensor, a microscope and a new scintillator, Ce-doped Gd3(Al,Ga)5O12 (Ce:GAGG) grown by the Czochralski process, has been developed. The noise, the dark current and the sensitivity of the CMOS camera (ORCA-Flash4.0, Hamamatsu) was revised and compared to a conventional CMOS, whose sensitivity is at the same level as that of a charge coupled device (CCD) camera. Without the scintillator, this system had a good position resolution of 2.1 ± 0.4 μm and we succeeded in obtaining the alpha-ray images using 1-mm thick Ce:GAGG crystal. This system can be applied for example to high energy X-ray beam profile monitor, etc.

Original languageEnglish
Article numberC07015
JournalJournal of Instrumentation
Issue number7
Publication statusPublished - 2014 Jul 1


  • Image processing
  • scintillation and light emission processes (solid gas and liquid scintillators)
  • Scintillators


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