Abstract
We propose a method of rapid construction of a structural-magnetic-electronic phase diagram of doped Mott insulators. The composition-spread method is utilized for fabricating a film whose doping concentration varies from 0 to 1 continuously. The concurrent x-ray diffractometer that measures x-ray diffraction spectra of all the composition simultaneously, the scanning superconducting quantum interference device microscope, and the infrared optical spectroscopy are employed for characterizing the film. A demonstration is given for a colossal magnetoresistive material, La1-xSrxMnO3.
Original language | English |
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Pages (from-to) | 3426-3428 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 77 |
Issue number | 21 |
DOIs | |
Publication status | Published - 2000 Nov 20 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)