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Recent achievements in the reliability of InP-based HEMTs
Tetsuya Suemitsu
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peer-review
8
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Physics
Hot Electron
100%
Degradation
100%
Cathodoluminescence
50%
Stability
50%
Reliability
50%
Achievement
50%
Chemistry
Degradation
100%
Aqueous Solution
50%
Cathodoluminescence
50%
Resistance
50%
Engineering
Reliability
50%
Reliability Issue
50%
Hot Electron
50%
Electron Effect
50%
Arts and Humanities
Mystery
50%