Recent progress of nano-mechanical mapping

Toshio Nishi, Sae Nagai, So Fujinami, Ken Nakajima

    Research output: Contribution to journalArticlepeer-review

    6 Citations (Scopus)


    Nano-mechanical mapping by atomic force microscopy has been developed as an useful application to measure mechanical properties of soft materials at nanometer scale. To date, the Hertzian theory was used for analyzing force-distance curves as the simplest model among several contact mechanics between elastic bodies. However, the preexisting methods based on this theory do not consider the adhesive interaction in principle, which cannot be neglected in the ambient condition. A new analytical method was introduced to estimate the elasticity and the adhesive energy simultaneously by means of the JKR theory, describing adhesive contact between elastic materials. Poly(dimethylsiloxane) (PDMS) and isobutylene-co-isoprene rubber (IIR) were analyzed to verify the applicable limit of the JKR analysis. For elastic samples such as PDMS, the force-deformation plots obtained experimentally were consistent with JKR theoretical curves. Meanwhile, for viscoelastic samples, especially for IIR, the experimental plots revealed large deviations from JKR curves depending on scanning velocity and maximum loading force. Some nano-rheological arguments were employed based on the difference between these specimens.

    Original languageEnglish
    Pages (from-to)37-47
    Number of pages11
    JournalChinese Journal of Polymer Science (English Edition)
    Issue number1
    Publication statusPublished - 2009 Jan


    • Atomic force microscopy
    • Force-distance curve
    • JKR theory
    • Nano-mechanical mapping

    ASJC Scopus subject areas

    • Chemical Engineering(all)
    • Organic Chemistry
    • Polymers and Plastics


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