TY - GEN
T1 - Reconstruction of stress corrosion cracks based on pulsed eddy current signals
AU - Wang, Xiaowei
AU - Xie, Shejuan
AU - Wang, Li
AU - Li, Yong
AU - Chen, Zhenmao
AU - Takagi, Toshiyuki
PY - 2012
Y1 - 2012
N2 - Reconstruction of Stress Corrosion Cracks (SCCs) using conventional Eddy Current Testing method (ECT) shows its limitation especially when dealing with deep SCCs. Recently, a new approach utilizing Pulsed Eddy Current Testing (PECT) signals has been proposed to reconstruct wall thinning defect based on a deterministic optimization method. It is because PECT is found advantageous over the conventional ECT due to its features of abundant frequency components and large exciting currents. In this study, stochastic optimization methods of neural network, tabu search, simulated annealing and genetic algorithm are introduced to reconstruct the SCC profile from the PECT signals. The efficiency and accuracy of these stochastic methods are evaluated and discussed.
AB - Reconstruction of Stress Corrosion Cracks (SCCs) using conventional Eddy Current Testing method (ECT) shows its limitation especially when dealing with deep SCCs. Recently, a new approach utilizing Pulsed Eddy Current Testing (PECT) signals has been proposed to reconstruct wall thinning defect based on a deterministic optimization method. It is because PECT is found advantageous over the conventional ECT due to its features of abundant frequency components and large exciting currents. In this study, stochastic optimization methods of neural network, tabu search, simulated annealing and genetic algorithm are introduced to reconstruct the SCC profile from the PECT signals. The efficiency and accuracy of these stochastic methods are evaluated and discussed.
KW - Fast forward solver
KW - Inverse problem
KW - Non-destructive testing
KW - Pulsed eddy current testing
KW - Stochastic methods
UR - http://www.scopus.com/inward/record.url?scp=84868632243&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84868632243&partnerID=8YFLogxK
U2 - 10.1109/ICEF.2012.6310346
DO - 10.1109/ICEF.2012.6310346
M3 - Conference contribution
AN - SCOPUS:84868632243
SN - 9781467313353
T3 - 2012 6th International Conference on Electromagnetic Field Problems and Applications, ICEF'2012
BT - 2012 6th International Conference on Electromagnetic Field Problems and Applications, ICEF'2012
T2 - 2012 6th International Conference on Electromagnetic Field Problems and Applications, ICEF'2012
Y2 - 19 June 2012 through 21 June 2012
ER -