Reducing structural change in aluminum coated polyethylene naphthalate foils during MeV proton irradiation

Masahiro Saito; Shinji Nagata; Fumitaka Nishiyama; Toshiyuki Isshiki; Katsumi Takahiro

doi:10.1016/j.vacuum.2012.03.038

Reducing structural change in aluminum coated polyethylene naphthalate foils during MeV proton irradiation

Masahiro Saito, Shinji Nagata, Fumitaka Nishiyama, Toshiyuki Isshiki, Katsumi Takahiro

Materials Design Division

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Structural change in polyethylene naphthalate (PEN) foil during MeV proton beam irradiation was investigated by ion beam induced luminescence (IBIL). An aluminum thin film (thickness: 20 nm) was sputter-deposited on the upper surface of 4 μm thick PEN foil to evaluate how Al coating effects structural change. IBIL analysis reveals that the Al coating clearly reduces damage induced by ion beam irradiation, probably due to the enhancement of electrical conductivity of the foil.

Original language	English
Pages (from-to)	153-156
Number of pages	4
Journal	Vacuum
Volume	89
Issue number	1
DOIs	https://doi.org/10.1016/j.vacuum.2012.03.038
Publication status	Published - 2013 Mar

Keywords

Aluminum coating
Ion beam analysis
Ion beam induced luminescence analysis
Polyethylene naphthalate
Proton irradiation

ASJC Scopus subject areas

Instrumentation
Condensed Matter Physics
Surfaces, Coatings and Films

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10.1016/j.vacuum.2012.03.038

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title = "Reducing structural change in aluminum coated polyethylene naphthalate foils during MeV proton irradiation",

abstract = "Structural change in polyethylene naphthalate (PEN) foil during MeV proton beam irradiation was investigated by ion beam induced luminescence (IBIL). An aluminum thin film (thickness: 20 nm) was sputter-deposited on the upper surface of 4 μm thick PEN foil to evaluate how Al coating effects structural change. IBIL analysis reveals that the Al coating clearly reduces damage induced by ion beam irradiation, probably due to the enhancement of electrical conductivity of the foil.",

keywords = "Aluminum coating, Ion beam analysis, Ion beam induced luminescence analysis, Polyethylene naphthalate, Proton irradiation",

author = "Masahiro Saito and Shinji Nagata and Fumitaka Nishiyama and Toshiyuki Isshiki and Katsumi Takahiro",

year = "2013",

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language = "English",

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T1 - Reducing structural change in aluminum coated polyethylene naphthalate foils during MeV proton irradiation

AU - Saito, Masahiro

AU - Nagata, Shinji

AU - Nishiyama, Fumitaka

AU - Isshiki, Toshiyuki

AU - Takahiro, Katsumi

PY - 2013/3

Y1 - 2013/3

N2 - Structural change in polyethylene naphthalate (PEN) foil during MeV proton beam irradiation was investigated by ion beam induced luminescence (IBIL). An aluminum thin film (thickness: 20 nm) was sputter-deposited on the upper surface of 4 μm thick PEN foil to evaluate how Al coating effects structural change. IBIL analysis reveals that the Al coating clearly reduces damage induced by ion beam irradiation, probably due to the enhancement of electrical conductivity of the foil.

AB - Structural change in polyethylene naphthalate (PEN) foil during MeV proton beam irradiation was investigated by ion beam induced luminescence (IBIL). An aluminum thin film (thickness: 20 nm) was sputter-deposited on the upper surface of 4 μm thick PEN foil to evaluate how Al coating effects structural change. IBIL analysis reveals that the Al coating clearly reduces damage induced by ion beam irradiation, probably due to the enhancement of electrical conductivity of the foil.

KW - Aluminum coating

KW - Ion beam analysis

KW - Ion beam induced luminescence analysis

KW - Polyethylene naphthalate

KW - Proton irradiation

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M3 - Article

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JO - Vacuum

JF - Vacuum

IS - 1

ER -

Reducing structural change in aluminum coated polyethylene naphthalate foils during MeV proton irradiation

Abstract

Keywords

ASJC Scopus subject areas

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