Abstract
The crystal structure of MoSi2 was investigated using a synchrotron X-ray powder diffraction method. From the Rietveld analysis it was shown that MoSi2 had a tetragonal structure of the space group I4/mmm and the lattice parameters were a = 0·32064(2) nm and c = 0·78478(8) nm. The position of Si atoms in the 4e site was determined to be (0, 0, 0·3353). There was a small shift in the z position, as compared to the previously reported value, 0·3333. The electronic structure of MoSi2 was calculated by the DV-Xα molecular orbital method employing the refined structural parameters, and this showed that there was a strong covalent bond between Si atoms aligned along the c axis in MoSi2.
Original language | English |
---|---|
Pages (from-to) | 523-527 |
Number of pages | 5 |
Journal | Intermetallics |
Volume | 6 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1998 |
Keywords
- A. molybdenum silicides
- B. crystallography
- Calculation
- E. electronic structure
- F. X-ray diffraction