Abstract
Relative Sensitivity Factors (RFs) for Fe, P, A1, Ti, V, Cr, Ni and Si Auger peaks are reported. Care must be taken when using RFs values for compounds owing to matrix effects.
Original language | English |
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Pages (from-to) | 91-95 |
Number of pages | 5 |
Journal | Journal of Electron Spectroscopy and Related Phenomena |
Volume | 40 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1986 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Radiation
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Spectroscopy
- Physical and Theoretical Chemistry