Remarkable hydrogen storage properties in three-layered Pd/Mg/Pd thin films

K. Higuchi, K. Yamamoto, H. Kajioka, K. Toiyama, M. Honda, S. Orimo, H. Fujii

Research output: Contribution to journalConference articlepeer-review

197 Citations (Scopus)


We have investigated hydrogen storage and structural properties in nano-composite three-layered Pd(50 nm)/Mg(x nm)/Pd(50 nm) films with x=25, 50, 200, 400 and 800 prepared by an RF-associated magnetron sputtering method. After hydrogenation under a hydrogen gas pressure of 0.1 MPa at 373 K for 24 h, the TDS profiles indicated that the Pd layers contain only 0.15-0.30 mass% hydrogen, whereas the Mg film contains ∼5.0 mass% hydrogen for all the films. The most striking feature is that the temperature corresponding to maximum dehydrogenation rate remarkably shifts to low temperature with increasing the thickness of Mg film, which decreased from 465 K at x=25 nm to 360 K at x=800 nm. These improvements could be understood by the concept of cooperative phenomenon which hydrogen shows in nano-scale composite regions.

Original languageEnglish
Pages (from-to)526-530
Number of pages5
JournalJournal of Alloys and Compounds
Publication statusPublished - 2002 Jan 17
EventProceedings of the International Symposium on Metal-Hydrogen (MH 2000) - Noosa Heads, QLD, Australia
Duration: 2000 Oct 12000 Oct 6


  • Hydrogen storage
  • Magnesium
  • Multi-layer
  • Palladium
  • Thin film


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