TY - JOUR
T1 - Reproduction of additive-type fluorescence moiré fringes by image drawing software and study of accuracy of fluorescence imprint alignment
AU - Nakagawa, Masaru
AU - Sutou, Kazue
AU - Hayakawa, Toshiaki
N1 - Publisher Copyright:
© 2020 The Japan Society of Applied Physics.
PY - 2020/6/1
Y1 - 2020/6/1
N2 - Based on the first report of the principle and practical observation of additive-type fluorescence moiré fringes for imprint alignment, we here studied the limit accuracy of the fluorescence imprint alignment using image drawing software, image processing software, and data analysis software. According to the practical conditions, fluorescence images of two assemblages having concave lines with a short pitch of p 1 = 4.0 μm and a long pitch of p 2 = 4.4 μm were reproduced on the mold and substrate. The analyzes of reproduced fluorescence images of moving the substrate without Fourier transform suggested that the minimum substrate shift of 0.04 pixels (5.2 nm) could be detected to be 0.045 58 pixels (5.9 nm). The detected placement error had a linear correlation to the substrate shift within 1290 nm.
AB - Based on the first report of the principle and practical observation of additive-type fluorescence moiré fringes for imprint alignment, we here studied the limit accuracy of the fluorescence imprint alignment using image drawing software, image processing software, and data analysis software. According to the practical conditions, fluorescence images of two assemblages having concave lines with a short pitch of p 1 = 4.0 μm and a long pitch of p 2 = 4.4 μm were reproduced on the mold and substrate. The analyzes of reproduced fluorescence images of moving the substrate without Fourier transform suggested that the minimum substrate shift of 0.04 pixels (5.2 nm) could be detected to be 0.045 58 pixels (5.9 nm). The detected placement error had a linear correlation to the substrate shift within 1290 nm.
UR - http://www.scopus.com/inward/record.url?scp=85083291578&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85083291578&partnerID=8YFLogxK
U2 - 10.35848/1347-4065/ab7ae1
DO - 10.35848/1347-4065/ab7ae1
M3 - Article
AN - SCOPUS:85083291578
SN - 0021-4922
VL - 59
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
M1 - SIIJ11
ER -