Resolving 45 pm with 300 kV aberration corrected STEM

H. Sawada; N. Shimura; K. Satoh; E. Okunishi; F. Hosokawa; N. Shibata; Y. Ikuhara

doi:10.1017/S1431927614002347

Resolving 45 pm with 300 kV aberration corrected STEM

H. Sawada, N. Shimura, K. Satoh, E. Okunishi, F. Hosokawa, N. Shibata, Y. Ikuhara

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	124-125
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614002347
Publication status	Published - 2014 Aug 1
Externally published	Yes
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: 2014 Aug 3 → 2014 Aug 7

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927614002347

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@article{a108fcd5b5274e9da7a6451b1957be54,

title = "Resolving 45 pm with 300 kV aberration corrected STEM",

author = "H. Sawada and N. Shimura and K. Satoh and E. Okunishi and F. Hosokawa and N. Shibata and Y. Ikuhara",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614002347",

language = "English",

volume = "20",

pages = "124--125",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - Resolving 45 pm with 300 kV aberration corrected STEM

AU - Sawada, H.

AU - Shimura, N.

AU - Satoh, K.

AU - Okunishi, E.

AU - Hosokawa, F.

AU - Shibata, N.

AU - Ikuhara, Y.

PY - 2014/8/1

Y1 - 2014/8/1

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U2 - 10.1017/S1431927614002347

DO - 10.1017/S1431927614002347

M3 - Conference article

AN - SCOPUS:84923383124

SN - 1431-9276

VL - 20

SP - 124

EP - 125

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Resolving 45 pm with 300 kV aberration corrected STEM

ASJC Scopus subject areas

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