Resonant x-ray scattering study of the URu2Si2 hidden-order phase

H. C. Walker, R. Caciuffo, D. Aoki, F. Bourdarot, G. H. Lander, J. Flouquet

Research output: Contribution to journalArticlepeer-review

28 Citations (Scopus)

Abstract

Resonant x-ray scattering experiments have been performed on a high-quality single crystal of URu2Si2, cut with a [101] direction specular. Data have been collected at the uranium M4 absorption edge below the hidden-order transition temperature, TH=17.5 K, exploring the region of the reciprocal space plane [H0L] with 1≤H≤1.85 and 1.8≤L≤2.1. Within the sensitivity of our measurements, the results obtained exclude electric quadrupoles of any symmetry as a hidden-order parameter with a propagation vector in the explored region.

Original languageEnglish
Article number193102
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume83
Issue number19
DOIs
Publication statusPublished - 2011 May 9

Fingerprint

Dive into the research topics of 'Resonant x-ray scattering study of the URu2Si2 hidden-order phase'. Together they form a unique fingerprint.

Cite this