Room temperature X- and gamma-ray detectors using thallium bromide crystals

K. Hitomi, O. Muroi, T. Shoji, T. Suehiro, Y. Hiratate

Research output: Contribution to journalConference articlepeer-review

32 Citations (Scopus)


Thallium bromide (TlBr) is a compound semiconductor with wide band gap (2.68 eV) and high X- and γ-ray stopping power. The TlBr crystals were grown by the horizontal travelling molten zone (TMZ) method using purified material. Two types of room temperature X- and γ-ray detectors were fabricated from the TlBr crystals: TlBr detectors with high detection efficiency for positron annihilation γ-ray (511 keV) detection and TlBr detectors with high-energy resolution for low-energy X-ray detection. The detector of the former type demonstrated energy resolution of 56 keV FWHM (11%) for 511 keV γ-rays. Energy resolution of 1.81 keV FWHM for 5.9 keV was obtained from the detector of the latter type. In order to analyze noise characteristics of the detector-preamplifier assembly, the equivalent noise charge (ENC) was measured as a function of the amplifier shaping time for the high-resolution detector. This analysis shows that parallel white noise and 1/f noise were dominant noise sources in the detector system. Current-voltage characteristics of the TlBr-detector with a small Peltier cooler were also measured. Significant reduction of the detector leakage current was observed for the cooled detectors.

Original languageEnglish
Pages (from-to)160-164
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Issue number1-2
Publication statusPublished - 1999 Oct 21
EventProceedings of the 1998 7th International Conference on Solid State Detectors - Nara, Jpn
Duration: 1998 Dec 41998 Dec 6


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