Abstract
Sulphur doping in zincoxide film was done by supplying zincsulphide species with pulsed-laser-deposition method. It was found that variations of lattice constants and band gaps with respect to sulphur content did not follow Vegard's law. The ZnO:S film showed semiconducting behavior with lower activation and resistivity than those of ZnO owing to higher carrier concentration.
Original language | English |
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Pages (from-to) | 3798-3800 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 81 |
Issue number | 20 |
DOIs | |
Publication status | Published - 2002 Nov 11 |