TY - JOUR
T1 - Scalability prospect of three-terminal magnetic domain-wall motion device
AU - Fukami, Shunsuke
AU - Ishiwata, Nobuyuki
AU - Kasai, Naoki
AU - Yamanouchi, Michihiko
AU - Sato, Hideo
AU - Ikeda, Shoji
AU - Ohno, Hideo
N1 - Funding Information:
This research was granted by the Japan Society for the Promotion of Science (JSPS) through the “Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST Program),” initiated by the Council for Science and Technology Policy (CSTP).
PY - 2012
Y1 - 2012
N2 - We studied a scaling property of a three-terminal domain wall (DW)-motion device, which is one of the promising candidates for future low-power nonvolatile memory and logic-in-memory architecture. Using several assumptions, we derived the scaling factor of the switching current, switching time, resistance of the write-current path, and data storage stability. We also quantitatively evaluated the variation of these parameters with the device size. It was found that the switching current and time decrease almost linearly with the device size, while the variation of the resistance of the write-current path is negligible. The switching current and time for 32-nm-wide device are less than 100 μA and 2 ns, respectively. A required critical field which assures a sufficient thermal stability of stored data was calculated for each generation. Furthermore, future issues and intrinsic limiter for the size reduction were discussed.
AB - We studied a scaling property of a three-terminal domain wall (DW)-motion device, which is one of the promising candidates for future low-power nonvolatile memory and logic-in-memory architecture. Using several assumptions, we derived the scaling factor of the switching current, switching time, resistance of the write-current path, and data storage stability. We also quantitatively evaluated the variation of these parameters with the device size. It was found that the switching current and time decrease almost linearly with the device size, while the variation of the resistance of the write-current path is negligible. The switching current and time for 32-nm-wide device are less than 100 μA and 2 ns, respectively. A required critical field which assures a sufficient thermal stability of stored data was calculated for each generation. Furthermore, future issues and intrinsic limiter for the size reduction were discussed.
KW - Magnetic domain walls
KW - magnetic random access memory
KW - nonvolatile logic
KW - scalability
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U2 - 10.1109/TMAG.2012.2187792
DO - 10.1109/TMAG.2012.2187792
M3 - Article
AN - SCOPUS:84862993875
SN - 0018-9464
VL - 48
SP - 2152
EP - 2157
JO - IEEE Transactions on Magnetics
JF - IEEE Transactions on Magnetics
IS - 7
M1 - 6151834
ER -