TY - GEN
T1 - Scalable serial-configuration scheme for MTJ/MOS-hybrid variation-resilient VLSI system
AU - Natsui, Masanori
AU - Hanyu, Takahiro
PY - 2012
Y1 - 2012
N2 - A new circuit-characteristic configuration scheme of a nonvolatile logic circuit, where magnetic tunnel junction (MTJ) devices are combined with MOS transistors, is proposed for realizing process, voltage, temperature (PVT)-variation-aware VLSI systems. Faulty logic-function results due to PVT variation are detected by monitoring input-output characteristics of each logic-circuit cell, and adjusted by configuring resistance values of MTJ devices embedded into each logic-circuit cell. The resistance values of MTJ devices are programmed in bit-serial manner by the proposed scheme, which can suppress not only area overhead due to incorporating configuration function but also the number of control signals from peripheral circuitry. It results in adding the configuration capability with compact and scalable implementation.
AB - A new circuit-characteristic configuration scheme of a nonvolatile logic circuit, where magnetic tunnel junction (MTJ) devices are combined with MOS transistors, is proposed for realizing process, voltage, temperature (PVT)-variation-aware VLSI systems. Faulty logic-function results due to PVT variation are detected by monitoring input-output characteristics of each logic-circuit cell, and adjusted by configuring resistance values of MTJ devices embedded into each logic-circuit cell. The resistance values of MTJ devices are programmed in bit-serial manner by the proposed scheme, which can suppress not only area overhead due to incorporating configuration function but also the number of control signals from peripheral circuitry. It results in adding the configuration capability with compact and scalable implementation.
UR - http://www.scopus.com/inward/record.url?scp=84868297506&partnerID=8YFLogxK
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U2 - 10.1109/NEWCAS.2012.6328965
DO - 10.1109/NEWCAS.2012.6328965
M3 - Conference contribution
AN - SCOPUS:84868297506
SN - 9781467308595
T3 - 2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
SP - 97
EP - 100
BT - 2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
T2 - 2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
Y2 - 17 June 2012 through 20 June 2012
ER -