A new probe using a tungsten needle for the scanning nonlinear dielectric microscope has been developed. This probe has a submicron resolution. This probe combined with a submicron stage is used to observe the distribution of domains in a lithium tantalate substrate with a proton exchanged inversion layer and also in polarized and depolarized lead zirconate titanate ceramics.
- Ferroelectric domain
- Lithium tantalate
- Proton exchanged inversion layer
- PZT ceramics
- Scanning nonlinear dielectric microscope