Scanning nonlinear dielectric microscope with submicron resolution

Yasuo Cho, Kaori Matsuura, Jun Ichi Kushibiki

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)


A new probe using a tungsten needle for the scanning nonlinear dielectric microscope has been developed. This probe has a submicron resolution. This probe combined with a submicron stage is used to observe the distribution of domains in a lithium tantalate substrate with a proton exchanged inversion layer and also in polarized and depolarized lead zirconate titanate ceramics.

Original languageEnglish
Pages (from-to)3132-3133
Number of pages2
JournalJapanese Journal of Applied Physics
Issue number5 SUPPL. B
Publication statusPublished - 1998 May


  • Ferroelectric domain
  • Lithium tantalate
  • Proton exchanged inversion layer
  • PZT ceramics
  • Scanning nonlinear dielectric microscope


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