Abstract
A new probe using a tungsten needle for the scanning nonlinear dielectric microscope has been developed. This probe has a submicron resolution. This probe combined with a submicron stage is used to observe the distribution of domains in a lithium tantalate substrate with a proton exchanged inversion layer and also in polarized and depolarized lead zirconate titanate ceramics.
| Original language | English |
|---|---|
| Pages (from-to) | 3132-3133 |
| Number of pages | 2 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 37 |
| Issue number | 5 SUPPL. B |
| DOIs | |
| Publication status | Published - 1998 May |
Keywords
- Ferroelectric domain
- Lithium tantalate
- PZT ceramics
- Proton exchanged inversion layer
- Scanning nonlinear dielectric microscope
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)