Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices

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16 Citations (Scopus)

Abstract

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.

Original languageEnglish
Title of host publicationScanning Nonlinear Dielectric Microscopy
Subtitle of host publicationInvestigation of Ferroelectric, Dielectric, and Semiconductor Mater. and Devices
PublisherElsevier
Pages1-246
Number of pages246
ISBN (Electronic)9780128172469
ISBN (Print)9780081028032
DOIs
Publication statusPublished - 2020 Jan 1

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