Scanning nonlinear dielectric microscopy with nanometer resolution

Yasuo Cho, Satoshi Kazuta, Kaori Matsuura, Hiroyuki Odagawa

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)


A very high-resolution scanning nonlinear dielectric microscope (SNDM) with nanometer resolution was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a nanometer order by measurement of the c-c domain wall of a BaTiO3 single crystal and of the domains in PZT thin film. Especially in a film measurement, the resolution was sub-nanometer. Next, we also demonstrate that the resolution of SNDM is higher than that of a conventional piezo-response imaging. Finally, we conducted a fundamental study on the writing of a domain inversion dot in PZT thin film and succeeded to have a very small domain dots of the size 25 nm.

Original languageEnglish
Pages (from-to)2131-2134
Number of pages4
JournalJournal of the European Ceramic Society
Issue number10-11
Publication statusPublished - 2001


  • Ba TiO and titanates
  • Ferroelectric properties
  • PZT
  • Scanning nonlinear dielectric microscopy


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