A very high-resolution scanning nonlinear dielectric microscope with nanometer resolution was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a nanometer order by measurement of the c-c domain wall of a BaTiO3 single crystal and of the domains in PZT and SBT thin films. Especially in a film measurement, the resolution was sub-nanometer order. Next, we also demonstrate that the resolution of SNDM is higher than that of a conventional piezo-response imaging. Finally, to check the performance of the SNDM system as a ferroelectric recording system, we conducted a fundamental study on the writing of domain inversion dot in PZT thin film and succeeded to have a very small domain dots with the size of 25 nm.
|Number of pages||4|
|Publication status||Published - 2000|
|Event||12th IEEE International Symposium on Applications of Ferroelectrics - Honolulu, HI, United States|
Duration: 2000 Jul 21 → 2000 Aug 2
|Conference||12th IEEE International Symposium on Applications of Ferroelectrics|
|Period||00/7/21 → 00/8/2|