Scanning probe microscopes go video rate and beyond

M. J. Rost, L. Crama, P. Schakel, E. Van Tol, G. B.E.M. Van Velzen-Williams, C. F. Overgauw, H. Ter Horst, H. Dekker, B. Okhuijsen, M. Seynen, A. Vijftigschild, P. Han, A. J. Katan, K. Schoots, R. Schumm, W. Van Loo, T. H. Oosterkamp, J. W.M. Frenken

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