Scanning tunneling microscopy investigation of single electron tunneling in Co-Al-O and Cu-Al-O granular films

K. Takanashi; S. Mitani; J. Chiba; H. Fujimori

doi:10.1063/1.372696

Scanning tunneling microscopy investigation of single electron tunneling in Co-Al-O and Cu-Al-O granular films

K. Takanashi, S. Mitani, J. Chiba, H. Fujimori

Research output: Contribution to journal › Conference article › peer-review

7 Citations (Scopus)

Abstract

We have investigated single electron tunneling in Co-Al-O and Cu-Al-O granular films using scanning tunneling microscopy (STM). Topographic images show well-defined granular structures where nanometer-sized metal granules are embedded in insulating matrix. The Coulomb staircases in the current-voltage (I-V) curves are clearly observed even at room temperature in both films. For the Co-Al-O film, furthermore, negative differential conductance appears in the Coulomb staircase.

Original language	English
Pages (from-to)	6331-6333
Number of pages	3
Journal	Journal of Applied Physics
Volume	87
Issue number	9 III
DOIs	https://doi.org/10.1063/1.372696
Publication status	Published - 2000 May 1
Externally published	Yes
Event	44th Annual Conference on Magnetism and Magnetic Materials - San Jose, CA, United States Duration: 1999 Nov 15 → 1999 Nov 18

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.372696

Cite this

@article{f7aee8eb442c49d1ae713156e5582dec,

title = "Scanning tunneling microscopy investigation of single electron tunneling in Co-Al-O and Cu-Al-O granular films",

abstract = "We have investigated single electron tunneling in Co-Al-O and Cu-Al-O granular films using scanning tunneling microscopy (STM). Topographic images show well-defined granular structures where nanometer-sized metal granules are embedded in insulating matrix. The Coulomb staircases in the current-voltage (I-V) curves are clearly observed even at room temperature in both films. For the Co-Al-O film, furthermore, negative differential conductance appears in the Coulomb staircase.",

author = "K. Takanashi and S. Mitani and J. Chiba and H. Fujimori",

year = "2000",

month = may,

day = "1",

doi = "10.1063/1.372696",

language = "English",

volume = "87",

pages = "6331--6333",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "9 III",

note = "44th Annual Conference on Magnetism and Magnetic Materials ; Conference date: 15-11-1999 Through 18-11-1999",

}

TY - JOUR

T1 - Scanning tunneling microscopy investigation of single electron tunneling in Co-Al-O and Cu-Al-O granular films

AU - Takanashi, K.

AU - Mitani, S.

AU - Chiba, J.

AU - Fujimori, H.

PY - 2000/5/1

Y1 - 2000/5/1

N2 - We have investigated single electron tunneling in Co-Al-O and Cu-Al-O granular films using scanning tunneling microscopy (STM). Topographic images show well-defined granular structures where nanometer-sized metal granules are embedded in insulating matrix. The Coulomb staircases in the current-voltage (I-V) curves are clearly observed even at room temperature in both films. For the Co-Al-O film, furthermore, negative differential conductance appears in the Coulomb staircase.

AB - We have investigated single electron tunneling in Co-Al-O and Cu-Al-O granular films using scanning tunneling microscopy (STM). Topographic images show well-defined granular structures where nanometer-sized metal granules are embedded in insulating matrix. The Coulomb staircases in the current-voltage (I-V) curves are clearly observed even at room temperature in both films. For the Co-Al-O film, furthermore, negative differential conductance appears in the Coulomb staircase.

UR - http://www.scopus.com/inward/record.url?scp=0004784841&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0004784841&partnerID=8YFLogxK

U2 - 10.1063/1.372696

DO - 10.1063/1.372696

M3 - Conference article

AN - SCOPUS:0004784841

SN - 0021-8979

VL - 87

SP - 6331

EP - 6333

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 9 III

T2 - 44th Annual Conference on Magnetism and Magnetic Materials

Y2 - 15 November 1999 through 18 November 1999

ER -

Scanning tunneling microscopy investigation of single electron tunneling in Co-Al-O and Cu-Al-O granular films

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this