Scanning tunneling microscopy study of fullerenes

T. Sakurai; X. D. Wang; Q. K. Xue; Y. Hasegawa; T. Hashizume; H. Shinohara

doi:10.1016/0079-6816(96)00005-6

Scanning tunneling microscopy study of fullerenes

T. Sakurai, X. D. Wang, Q. K. Xue, Y. Hasegawa, T. Hashizume, H. Shinohara

Research output: Contribution to journal › Review article › peer-review

89 Citations (Scopus)

Abstract

Scanning tunneling microscopy investigations of adsorption and film growth of various fullerenes on semiconductor and metal surfaces are reviewed. The fullerenes being studied are C₆₀, C₇₀, C₈₄, Sc@C₈₂ and Y@C₈₂ and the substrates being used for adsorption are Si (111), Si (100), Ge (111), GaAs (110), GaAs (001), Au (111), Au (110), Au (100), Cu (111) and Ag (111) surfaces.

Original language	English
Pages (from-to)	263-408
Number of pages	146
Journal	Progress in Surface Science
Volume	51
Issue number	4
DOIs	https://doi.org/10.1016/0079-6816(96)00005-6
Publication status	Published - 1996 Jan 1

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/0079-6816(96)00005-6

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abstract = "Scanning tunneling microscopy investigations of adsorption and film growth of various fullerenes on semiconductor and metal surfaces are reviewed. The fullerenes being studied are C60, C70, C84, Sc@C82 and Y@C82 and the substrates being used for adsorption are Si (111), Si (100), Ge (111), GaAs (110), GaAs (001), Au (111), Au (110), Au (100), Cu (111) and Ag (111) surfaces.",

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AU - Sakurai, T.

AU - Wang, X. D.

AU - Xue, Q. K.

AU - Hasegawa, Y.

AU - Hashizume, T.

AU - Shinohara, H.

PY - 1996/1/1

Y1 - 1996/1/1

N2 - Scanning tunneling microscopy investigations of adsorption and film growth of various fullerenes on semiconductor and metal surfaces are reviewed. The fullerenes being studied are C60, C70, C84, Sc@C82 and Y@C82 and the substrates being used for adsorption are Si (111), Si (100), Ge (111), GaAs (110), GaAs (001), Au (111), Au (110), Au (100), Cu (111) and Ag (111) surfaces.

AB - Scanning tunneling microscopy investigations of adsorption and film growth of various fullerenes on semiconductor and metal surfaces are reviewed. The fullerenes being studied are C60, C70, C84, Sc@C82 and Y@C82 and the substrates being used for adsorption are Si (111), Si (100), Ge (111), GaAs (110), GaAs (001), Au (111), Au (110), Au (100), Cu (111) and Ag (111) surfaces.

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JO - Progress in Surface Science

JF - Progress in Surface Science

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Scanning tunneling microscopy study of fullerenes

Abstract

ASJC Scopus subject areas

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