Scanning tunneling microscopy investigations of adsorption and film growth of various fullerenes on semiconductor and metal surfaces are reviewed. The fullerenes being studied are C60, C70, C84, Sc@C82 and Y@C82 and the substrates being used for adsorption are Si (111), Si (100), Ge (111), GaAs (110), GaAs (001), Au (111), Au (110), Au (100), Cu (111) and Ag (111) surfaces.
|Number of pages||146|
|Journal||Progress in Surface Science|
|Publication status||Published - 1996 Jan 1|
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films