@inproceedings{f263cd91e2a14695b31827eebe3e4336,
title = "Semi-Supervised learning for electron microscopy image segmentation",
author = "Eichi Takaya and Yusuke Takeichi and Mamiko Ozaki and Satoshi Kurihara",
year = "2019",
language = "English",
series = "33rd AAAI Conference on Artificial Intelligence, AAAI 2019, 31st Innovative Applications of Artificial Intelligence Conference, IAAI 2019 and the 9th AAAI Symposium on Educational Advances in Artificial Intelligence, EAAI 2019",
publisher = "AAAI press",
pages = "10047--10048",
booktitle = "33rd AAAI Conference on Artificial Intelligence, AAAI 2019, 31st Innovative Applications of Artificial Intelligence Conference, IAAI 2019 and the 9th AAAI Symposium on Educational Advances in Artificial Intelligence, EAAI 2019",
note = "33rd AAAI Conference on Artificial Intelligence, AAAI 2019, 31st Annual Conference on Innovative Applications of Artificial Intelligence, IAAI 2019 and the 9th AAAI Symposium on Educational Advances in Artificial Intelligence, EAAI 2019 ; Conference date: 27-01-2019 Through 01-02-2019",
}