Si nano-wire SPM probe grown by field evaporation with UHV STM

Engineering

• Si Substrate 100%
• Scanning Probe Microscope 100%
• Fields 100%
• Nanowire 50%
• Electric Potential 50%
• Evaporation 50%
• Fabrication Technique 50%
• Atomic Force Microscope 50%
• Scanning Tunneling Microscope 50%
• Si Cantilever 50%
• Substrates 50%
• High Vacuum 50%

Agricultural and Biological Sciences

• Fields 100%
• Molecular Wire 50%
• Evaporation 50%