Significant reduction of critical currents in MRAM designs using dual free layer with perpendicular and in-plane anisotropy

D. Suess, C. Vogler, F. Bruckner, H. Sepehri-Amin, C. Abert

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Significant reduction of critical currents in MRAM designs using dual free layer with perpendicular and in-plane anisotropy'. Together they form a unique fingerprint.

Engineering

Physics

Material Science