Simulation of AFM/LFM by molecular dynamics: Role of lateral force in contact-mode AFM imaging

Masaharu Komiyama; Kazuya Tsujimichi; Katsuyuki Tazawa; Akiyasu Hirotani; Hideo Yamano; Momoji Kubo; Ewa Broclawik; Akira Miyamoto

doi:10.1016/0039-6028(96)00097-0

Simulation of AFM/LFM by molecular dynamics: Role of lateral force in contact-mode AFM imaging

Masaharu Komiyama, Kazuya Tsujimichi, Katsuyuki Tazawa, Akiyasu Hirotani, Hideo Yamano, Momoji Kubo, Ewa Broclawik, Akira Miyamoto

IMR - Materials Design Division

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

A recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation code for calculating and evaluating surface structures) has been extended to incorporate the molecular dynamics method. Using this ACCESS-II, LFM (lateral force microscopy) as well as AFM simulations were performed under dynamic conditions. Lateral forces felt by the tip exhibited a behavior that leads to the typical stick-slip phenomenon, and their magnitudes are close to that of the vertical force. The role of the lateral forces in contact-mode AFM imaging is discussed.

Original language	English
Pages (from-to)	222-227
Number of pages	6
Journal	Surface Science
Volume	357-358
DOIs	https://doi.org/10.1016/0039-6028(96)00097-0
Publication status	Published - 1996 Jun 20

Keywords

Atom-solid interactions
Atomic force microscopy
Copper
Molecular dynamics
Surface relaxation and reconstruction
Surface structure, morphology, roughness, and topography

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10.1016/0039-6028(96)00097-0

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title = "Simulation of AFM/LFM by molecular dynamics: Role of lateral force in contact-mode AFM imaging",

abstract = "A recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation code for calculating and evaluating surface structures) has been extended to incorporate the molecular dynamics method. Using this ACCESS-II, LFM (lateral force microscopy) as well as AFM simulations were performed under dynamic conditions. Lateral forces felt by the tip exhibited a behavior that leads to the typical stick-slip phenomenon, and their magnitudes are close to that of the vertical force. The role of the lateral forces in contact-mode AFM imaging is discussed.",

keywords = "Atom-solid interactions, Atomic force microscopy, Copper, Molecular dynamics, Surface relaxation and reconstruction, Surface structure, morphology, roughness, and topography",

author = "Masaharu Komiyama and Kazuya Tsujimichi and Katsuyuki Tazawa and Akiyasu Hirotani and Hideo Yamano and Momoji Kubo and Ewa Broclawik and Akira Miyamoto",

note = "Funding Information: This work is supported in part by the Foundation for Promotion of Material Science and Technology of Japan.",

year = "1996",

month = jun,

day = "20",

doi = "10.1016/0039-6028(96)00097-0",

language = "English",

volume = "357-358",

pages = "222--227",

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TY - JOUR

T1 - Simulation of AFM/LFM by molecular dynamics

T2 - Role of lateral force in contact-mode AFM imaging

AU - Komiyama, Masaharu

AU - Tsujimichi, Kazuya

AU - Tazawa, Katsuyuki

AU - Hirotani, Akiyasu

AU - Yamano, Hideo

AU - Kubo, Momoji

AU - Broclawik, Ewa

AU - Miyamoto, Akira

N1 - Funding Information: This work is supported in part by the Foundation for Promotion of Material Science and Technology of Japan.

PY - 1996/6/20

Y1 - 1996/6/20

N2 - A recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation code for calculating and evaluating surface structures) has been extended to incorporate the molecular dynamics method. Using this ACCESS-II, LFM (lateral force microscopy) as well as AFM simulations were performed under dynamic conditions. Lateral forces felt by the tip exhibited a behavior that leads to the typical stick-slip phenomenon, and their magnitudes are close to that of the vertical force. The role of the lateral forces in contact-mode AFM imaging is discussed.

AB - A recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation code for calculating and evaluating surface structures) has been extended to incorporate the molecular dynamics method. Using this ACCESS-II, LFM (lateral force microscopy) as well as AFM simulations were performed under dynamic conditions. Lateral forces felt by the tip exhibited a behavior that leads to the typical stick-slip phenomenon, and their magnitudes are close to that of the vertical force. The role of the lateral forces in contact-mode AFM imaging is discussed.

KW - Atom-solid interactions

KW - Atomic force microscopy

KW - Copper

KW - Molecular dynamics

KW - Surface relaxation and reconstruction

KW - Surface structure, morphology, roughness, and topography

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SN - 0039-6028

VL - 357-358

SP - 222

EP - 227

JO - Surface Science

JF - Surface Science

ER -

Simulation of AFM/LFM by molecular dynamics: Role of lateral force in contact-mode AFM imaging

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Keywords

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