A recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation code for calculating and evaluating surface structures) has been extended to incorporate the molecular dynamics method. Using this ACCESS-II, LFM (lateral force microscopy) as well as AFM simulations were performed under dynamic conditions. Lateral forces felt by the tip exhibited a behavior that leads to the typical stick-slip phenomenon, and their magnitudes are close to that of the vertical force. The role of the lateral forces in contact-mode AFM imaging is discussed.
- Atom-solid interactions
- Atomic force microscopy
- Molecular dynamics
- Surface relaxation and reconstruction
- Surface structure, morphology, roughness, and topography