Simulation of atomic force microscopy images of cleaved mica surfaces

Kazuya Tsujimichi; Hiroyuki Tamura; Akiyasu Hirotani; Momoji Kubo; Masaharu Komiyama; Akira Miyamoto

doi:10.1021/jp9637800

Simulation of atomic force microscopy images of cleaved mica surfaces

Kazuya Tsujimichi, Hiroyuki Tamura, Akiyasu Hirotani, Momoji Kubo, Masaharu Komiyama, Akira Miyamoto

IMR - Materials Design Division

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Taking into account the Coulomb and exchange forces, atomic force microscopy (AFM) and lateral force microscopy (LFM) simulations were performed for a Si(OH)₄ tip and a cleaved mica surface under planer two-dimensional periodic boundary conditions. Imaging of the individual oxygen atoms in hexagonal oxygen rings and/or K⁺ ions on a cleaved mica surface strongly depended on the tip orientation and the applied force. Experimentally obtained AFM images of cleaved mica surfaces were interpreted in terms of the present simulation results.

Original language	English
Pages (from-to)	4260-4264
Number of pages	5
Journal	Journal of Physical Chemistry B
Volume	101
Issue number	21
DOIs	https://doi.org/10.1021/jp9637800
Publication status	Published - 1997 May 22

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title = "Simulation of atomic force microscopy images of cleaved mica surfaces",

abstract = "Taking into account the Coulomb and exchange forces, atomic force microscopy (AFM) and lateral force microscopy (LFM) simulations were performed for a Si(OH)4 tip and a cleaved mica surface under planer two-dimensional periodic boundary conditions. Imaging of the individual oxygen atoms in hexagonal oxygen rings and/or K+ ions on a cleaved mica surface strongly depended on the tip orientation and the applied force. Experimentally obtained AFM images of cleaved mica surfaces were interpreted in terms of the present simulation results.",

author = "Kazuya Tsujimichi and Hiroyuki Tamura and Akiyasu Hirotani and Momoji Kubo and Masaharu Komiyama and Akira Miyamoto",

year = "1997",

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T1 - Simulation of atomic force microscopy images of cleaved mica surfaces

AU - Tsujimichi, Kazuya

AU - Tamura, Hiroyuki

AU - Hirotani, Akiyasu

AU - Kubo, Momoji

AU - Komiyama, Masaharu

AU - Miyamoto, Akira

PY - 1997/5/22

Y1 - 1997/5/22

N2 - Taking into account the Coulomb and exchange forces, atomic force microscopy (AFM) and lateral force microscopy (LFM) simulations were performed for a Si(OH)4 tip and a cleaved mica surface under planer two-dimensional periodic boundary conditions. Imaging of the individual oxygen atoms in hexagonal oxygen rings and/or K+ ions on a cleaved mica surface strongly depended on the tip orientation and the applied force. Experimentally obtained AFM images of cleaved mica surfaces were interpreted in terms of the present simulation results.

AB - Taking into account the Coulomb and exchange forces, atomic force microscopy (AFM) and lateral force microscopy (LFM) simulations were performed for a Si(OH)4 tip and a cleaved mica surface under planer two-dimensional periodic boundary conditions. Imaging of the individual oxygen atoms in hexagonal oxygen rings and/or K+ ions on a cleaved mica surface strongly depended on the tip orientation and the applied force. Experimentally obtained AFM images of cleaved mica surfaces were interpreted in terms of the present simulation results.

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SP - 4260

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JO - Journal of Physical Chemistry B

JF - Journal of Physical Chemistry B

IS - 21

ER -

Simulation of atomic force microscopy images of cleaved mica surfaces

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