Simulations of the effects of tip apex geometries on atomic force microscopy images

Simulation works on the effects of tip apex geometries on atomic force microscopy (AFM) images were examined. Tips and samples employed in those simulations were mostly made of a single component. Short-range interatomic potentials such as Lennard-Jones and Morse were used. With these potentials, it was found that a single atom tip (a tip with an atom protruding at its apex) is necessary for obtaining true atomic resolution. In many cases flat tip geometries (tips with multiple atoms at their apexes) produce various images that do not correspond to the surface atom arrangements, which may lead to various faulty AFM image interpretations.