TY - JOUR
T1 - Simultaneous Evaluation of Permeability and Permittivity Using a Flexible Microstrip Line-Type Probe up to 67 GHz
AU - Yabukami, S.
AU - Iwasaki, C.
AU - Okita, K.
AU - Nozawa, K.
AU - Takahashi, S.
AU - Chatani, K.
N1 - Publisher Copyright:
© 1965-2012 IEEE.
PY - 2022/2/1
Y1 - 2022/2/1
N2 - Complex relative permeability and permittivity were evaluated simultaneously in the band of 100 MHz-67 GHz using a flexible microstrip line-type probe. In principle, the probe can evaluate the permeability and permittivity of electromagnetic materials regardless of size. The measured permeability and permittivity were obtained from the transmission coefficient ( S_21 ). Since S_21 under the infinite magnetic field can be estimated by changing the dc magnetic field stepwise, the magnetic and dielectric signals were separated accurately. The complex permeability and permittivity of a NiZn ferrite sheet (10 mm ×10 mm, 0.1 mm thick) and polytetrafluoroethylene (PTFE) (25 mm ×25 mm, 0.79 mm thick) were evaluated accurately.
AB - Complex relative permeability and permittivity were evaluated simultaneously in the band of 100 MHz-67 GHz using a flexible microstrip line-type probe. In principle, the probe can evaluate the permeability and permittivity of electromagnetic materials regardless of size. The measured permeability and permittivity were obtained from the transmission coefficient ( S_21 ). Since S_21 under the infinite magnetic field can be estimated by changing the dc magnetic field stepwise, the magnetic and dielectric signals were separated accurately. The complex permeability and permittivity of a NiZn ferrite sheet (10 mm ×10 mm, 0.1 mm thick) and polytetrafluoroethylene (PTFE) (25 mm ×25 mm, 0.79 mm thick) were evaluated accurately.
KW - Complex relative permeability measurement
KW - microstrip line-type probe
KW - permittivity measurement
KW - sample size limitation
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U2 - 10.1109/TMAG.2021.3091522
DO - 10.1109/TMAG.2021.3091522
M3 - Article
AN - SCOPUS:85112406513
SN - 0018-9464
VL - 58
JO - IEEE Transactions on Magnetics
JF - IEEE Transactions on Magnetics
IS - 2
ER -