@article{3aa73d3425b8454d985001905ef40971,
title = "Simultaneous observation of bright-and dark-field large-angle convergent-beam electron diffraction patterns",
keywords = "Bright-field, Convergent-beam electron diffraction, Dark-field, Large angle",
author = "Masami Terauchi and Michiyoshi Tanaka",
note = "Funding Information: Acknowledgments. The authors wish to thank Mr. K. Ueno, JEOL Ltd., for his helpful discussion. Thanks are also due to Mr. F. Sato for his technical assistance. This work was supported partly by a Grant-in-Aid for Scientific Research from the Ministry of Education, Science and Culture, Japan.",
year = "1985",
doi = "10.1093/oxfordjournals.jmicro.a050502",
language = "English",
volume = "34",
pages = "128--135",
journal = "Microscopy (Oxford, England)",
issn = "2050-5698",
publisher = "Oxford University Press",
number = "2",
}