TY - GEN
T1 - Single-mode terahertz emission from current-injection graphene-channel transistor under population inversion
AU - Tamamushi, Gen
AU - Watanabe, Takayuki
AU - Dubinov, Alexander A.
AU - Mitsushio, Junki
AU - Wako, Hiroyuki
AU - Satou, Akira
AU - Suemitsu, Tetsuya
AU - Fukidome, Hirokazu
AU - Suemitsu, Maki
AU - Ryzhii, Maxim
AU - Ryzhii, Victor
AU - Otsuji, Taiichi
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/8/22
Y1 - 2016/8/22
N2 - Optical and/or injection pumping of graphene can enable negative-dynamic conductivity in the terahertz (THz) spectral range, which may lead to new types of THz lasers [1,2]. In the graphene structures with p-i-n junctions, the injected electrons and holes have relatively low energies compared with those in optical pumping, so that the effect of carrier cooling can be rather pronounced, providing a significant advantage of the injection pumping in realization of graphene THz lasers [3,4]. We implement a forward-biased graphene structure with a lateral p-i-n junction in a distributed-feedback dual-gate graphene-channel field-effect transistor (DFB-DG-GFET) and experimentally observe a single mode emission at 5.2 THz at 100K. The device exhibits a nonlinear threshold-like behavior.
AB - Optical and/or injection pumping of graphene can enable negative-dynamic conductivity in the terahertz (THz) spectral range, which may lead to new types of THz lasers [1,2]. In the graphene structures with p-i-n junctions, the injected electrons and holes have relatively low energies compared with those in optical pumping, so that the effect of carrier cooling can be rather pronounced, providing a significant advantage of the injection pumping in realization of graphene THz lasers [3,4]. We implement a forward-biased graphene structure with a lateral p-i-n junction in a distributed-feedback dual-gate graphene-channel field-effect transistor (DFB-DG-GFET) and experimentally observe a single mode emission at 5.2 THz at 100K. The device exhibits a nonlinear threshold-like behavior.
UR - http://www.scopus.com/inward/record.url?scp=84987723027&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84987723027&partnerID=8YFLogxK
U2 - 10.1109/DRC.2016.7548491
DO - 10.1109/DRC.2016.7548491
M3 - Conference contribution
AN - SCOPUS:84987723027
T3 - Device Research Conference - Conference Digest, DRC
BT - 74th Annual Device Research Conference, DRC 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 74th Annual Device Research Conference, DRC 2016
Y2 - 19 June 2016 through 22 June 2016
ER -