TY - JOUR
T1 - Soft magnetic properties and microstructure of high moment Fe-N-Al-O films for recording head materials
AU - Ikeda, S.
AU - Uehara, Y.
AU - Tagawa, I.
AU - Takeguchi, N.
AU - Kakehi, M.
PY - 2000
Y1 - 2000
N2 - The effects of additional elements, such as Al and O, on the magnetic and electrical properties of the Fe-N-Al-O films were studied. As a result, the relationship between soft magnetic properties and microstructure was established.
AB - The effects of additional elements, such as Al and O, on the magnetic and electrical properties of the Fe-N-Al-O films were studied. As a result, the relationship between soft magnetic properties and microstructure was established.
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M3 - Conference article
AN - SCOPUS:0033714901
SN - 0074-6843
SP - CD-07
JO - Digests of the Intermag Conference
JF - Digests of the Intermag Conference
T2 - 2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG
Y2 - 9 April 2000 through 13 April 2000
ER -