TY - JOUR
T1 - Soft X-ray dark-field imaging microscope with Wolter-type grazing-incidence mirrors
AU - Takano, Hidekazu
AU - Yokota, Kazuhiro
AU - Aoki, Sadao
PY - 1999
Y1 - 1999
N2 - A soft X-ray dark-field imaging microscope with Wolter-type mirrors was constructed on a laboratory scale. An annular aperture stop was used to cut off the direct beam, which satisfied the dark-field condition. The image is formed only with scattered X-rays from the object. It provides not only absorption but also phase shift information with high contrast. In the dark field, fine particles and defects of the sample that had not been seen in the bright-field image, could be observed. The image formation was analyzed by computer simulation. The dark-field images of organic specimens were also observed and compared with the bright-field images.
AB - A soft X-ray dark-field imaging microscope with Wolter-type mirrors was constructed on a laboratory scale. An annular aperture stop was used to cut off the direct beam, which satisfied the dark-field condition. The image is formed only with scattered X-rays from the object. It provides not only absorption but also phase shift information with high contrast. In the dark field, fine particles and defects of the sample that had not been seen in the bright-field image, could be observed. The image formation was analyzed by computer simulation. The dark-field images of organic specimens were also observed and compared with the bright-field images.
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U2 - 10.1143/jjap.38.l1485
DO - 10.1143/jjap.38.l1485
M3 - Article
AN - SCOPUS:0033352649
SN - 0021-4922
VL - 38
SP - L1485-L1487
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - 12 A
ER -