Solidification thickness dependent electrostriction of polyurethane films

Masae Kanda; Kaori Yuse; Benoit Guiffard; Laurent Lebrun; Yoshitake Nishi; Daniel Guyomar

doi:10.2320/matertrans.MAW201208

Solidification thickness dependent electrostriction of polyurethane films

Masae Kanda, Kaori Yuse, Benoit Guiffard, Laurent Lebrun, Yoshitake Nishi, Daniel Guyomar

IFS - Lyon Center (Integration Research Center for Materials and Fluid Sciences)

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

To obtain large electrostriction (Smax) at low electric filed (Emax), a dependence of the solidification thickness (L) on Smax was investigated for polyurethane films. Thinning the films remarkably enhanced Smax at high Emax at 20MV/m, whereas thick films apparently exhibited higher Smax at low Emax of less than 3MV/m. The L dependent Smax from 5.01% for 140μm thickness to 30.99% for 28μm thickness exhibited linear relationship of pure polyurethane. Considering crystalline volume fraction and crystalline periodicity, the L dependent Smax was explained.

Original language	English
Pages (from-to)	1806-1809
Number of pages	4
Journal	Materials Transactions
Volume	53
Issue number	10
DOIs	https://doi.org/10.2320/matertrans.MAW201208
Publication status	Published - 2012

Keywords

Crystalline periodicity
Electro active
Electrostriction

Access to Document

10.2320/matertrans.MAW201208

Cite this

@article{118ac1b5753147678b28d6d13097b333,

title = "Solidification thickness dependent electrostriction of polyurethane films",

abstract = "To obtain large electrostriction (Smax) at low electric filed (Emax), a dependence of the solidification thickness (L) on Smax was investigated for polyurethane films. Thinning the films remarkably enhanced Smax at high Emax at 20MV/m, whereas thick films apparently exhibited higher Smax at low Emax of less than 3MV/m. The L dependent Smax from 5.01% for 140μm thickness to 30.99% for 28μm thickness exhibited linear relationship of pure polyurethane. Considering crystalline volume fraction and crystalline periodicity, the L dependent Smax was explained.",

keywords = "Crystalline periodicity, Electro active, Electrostriction",

author = "Masae Kanda and Kaori Yuse and Benoit Guiffard and Laurent Lebrun and Yoshitake Nishi and Daniel Guyomar",

year = "2012",

doi = "10.2320/matertrans.MAW201208",

language = "English",

volume = "53",

pages = "1806--1809",

journal = "Materials Transactions",

issn = "1345-9678",

publisher = "Japan Institute of Metals (JIM)",

number = "10",

}

TY - JOUR

T1 - Solidification thickness dependent electrostriction of polyurethane films

AU - Kanda, Masae

AU - Yuse, Kaori

AU - Guiffard, Benoit

AU - Lebrun, Laurent

AU - Nishi, Yoshitake

AU - Guyomar, Daniel

PY - 2012

Y1 - 2012

N2 - To obtain large electrostriction (Smax) at low electric filed (Emax), a dependence of the solidification thickness (L) on Smax was investigated for polyurethane films. Thinning the films remarkably enhanced Smax at high Emax at 20MV/m, whereas thick films apparently exhibited higher Smax at low Emax of less than 3MV/m. The L dependent Smax from 5.01% for 140μm thickness to 30.99% for 28μm thickness exhibited linear relationship of pure polyurethane. Considering crystalline volume fraction and crystalline periodicity, the L dependent Smax was explained.

AB - To obtain large electrostriction (Smax) at low electric filed (Emax), a dependence of the solidification thickness (L) on Smax was investigated for polyurethane films. Thinning the films remarkably enhanced Smax at high Emax at 20MV/m, whereas thick films apparently exhibited higher Smax at low Emax of less than 3MV/m. The L dependent Smax from 5.01% for 140μm thickness to 30.99% for 28μm thickness exhibited linear relationship of pure polyurethane. Considering crystalline volume fraction and crystalline periodicity, the L dependent Smax was explained.

KW - Crystalline periodicity

KW - Electro active

KW - Electrostriction

UR - http://www.scopus.com/inward/record.url?scp=84866943814&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84866943814&partnerID=8YFLogxK

U2 - 10.2320/matertrans.MAW201208

DO - 10.2320/matertrans.MAW201208

M3 - Article

AN - SCOPUS:84866943814

SN - 1345-9678

VL - 53

SP - 1806

EP - 1809

JO - Materials Transactions

JF - Materials Transactions

IS - 10

ER -

Solidification thickness dependent electrostriction of polyurethane films

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this