Spatial redistribution of oxygen ions in oxide resistance switching device after forming process

Takeshi Yajima; Kohei Fujiwara; Aiko Nakao; Tomohiro Kobayashi; Toshiyuki Tanaka; Kei Sunouchi; Yoshiaki Suzuki; Mai Takeda; Kentaro Kojima; Yoshinobu Nakamura; Kouji Taniguchi; Hidenori Takagi

doi:10.1143/JJAP.49.060215

Spatial redistribution of oxygen ions in oxide resistance switching device after forming process

Takeshi Yajima, Kohei Fujiwara, Aiko Nakao, Tomohiro Kobayashi, Toshiyuki Tanaka, Kei Sunouchi, Yoshiaki Suzuki, Mai Takeda, Kentaro Kojima, Yoshinobu Nakamura, Kouji Taniguchi, Hidenori Takagi

Materials Development Division

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

The change in the spatial distribution of oxygen ions after an initial voltage application called the forming process was investigated for oxide resistance switching devices by secondary ion mass spectrometry mapping. To track the motion of oxygen ions, tracer ¹⁸O ions were implanted in a planar Pt/CuO/Pt device. We found clear evidence for the oxygen reduction in the conductive bridge structure formed between two electrodes. In addition, the oxygen ions in the bridge structure drift to the anode, implying the oxygen diffusion (migration) induced by high electric field and/or current density. We discuss those results in terms of a filament model.

Original language	English
Pages (from-to)	602151-602153
Number of pages	3
Journal	Japanese journal of applied physics
Volume	49
Issue number	6 PART 1
DOIs	https://doi.org/10.1143/JJAP.49.060215
Publication status	Published - 2010 Jun

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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title = "Spatial redistribution of oxygen ions in oxide resistance switching device after forming process",

abstract = "The change in the spatial distribution of oxygen ions after an initial voltage application called the forming process was investigated for oxide resistance switching devices by secondary ion mass spectrometry mapping. To track the motion of oxygen ions, tracer 18O ions were implanted in a planar Pt/CuO/Pt device. We found clear evidence for the oxygen reduction in the conductive bridge structure formed between two electrodes. In addition, the oxygen ions in the bridge structure drift to the anode, implying the oxygen diffusion (migration) induced by high electric field and/or current density. We discuss those results in terms of a filament model.",

author = "Takeshi Yajima and Kohei Fujiwara and Aiko Nakao and Tomohiro Kobayashi and Toshiyuki Tanaka and Kei Sunouchi and Yoshiaki Suzuki and Mai Takeda and Kentaro Kojima and Yoshinobu Nakamura and Kouji Taniguchi and Hidenori Takagi",

year = "2010",

month = jun,

doi = "10.1143/JJAP.49.060215",

language = "English",

volume = "49",

pages = "602151--602153",

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T1 - Spatial redistribution of oxygen ions in oxide resistance switching device after forming process

AU - Yajima, Takeshi

AU - Fujiwara, Kohei

AU - Nakao, Aiko

AU - Kobayashi, Tomohiro

AU - Tanaka, Toshiyuki

AU - Sunouchi, Kei

AU - Suzuki, Yoshiaki

AU - Takeda, Mai

AU - Kojima, Kentaro

AU - Nakamura, Yoshinobu

AU - Taniguchi, Kouji

AU - Takagi, Hidenori

PY - 2010/6

Y1 - 2010/6

N2 - The change in the spatial distribution of oxygen ions after an initial voltage application called the forming process was investigated for oxide resistance switching devices by secondary ion mass spectrometry mapping. To track the motion of oxygen ions, tracer 18O ions were implanted in a planar Pt/CuO/Pt device. We found clear evidence for the oxygen reduction in the conductive bridge structure formed between two electrodes. In addition, the oxygen ions in the bridge structure drift to the anode, implying the oxygen diffusion (migration) induced by high electric field and/or current density. We discuss those results in terms of a filament model.

AB - The change in the spatial distribution of oxygen ions after an initial voltage application called the forming process was investigated for oxide resistance switching devices by secondary ion mass spectrometry mapping. To track the motion of oxygen ions, tracer 18O ions were implanted in a planar Pt/CuO/Pt device. We found clear evidence for the oxygen reduction in the conductive bridge structure formed between two electrodes. In addition, the oxygen ions in the bridge structure drift to the anode, implying the oxygen diffusion (migration) induced by high electric field and/or current density. We discuss those results in terms of a filament model.

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JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

IS - 6 PART 1

ER -

Spatial redistribution of oxygen ions in oxide resistance switching device after forming process

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