Abstract
The interplane spin cross relaxation time Tx measured by high frequency ESR in X-ray irradiated κ-(BEDT-TTF)2Cu[N(CN)2]Cl is compared to the interplane resisitivity ρ⊥and the in-plane resistivity ρII between 50 K and 250 K. The irradiation transforms the semiconductor behavior of the non-irradiated crystal into metallic. Irradiation decreases Tx, ρ⊥ and ρII but the ratio Tx/ρ⊥ and ρ⊥/ρII remain unchanged between 50 and 250 K. Models describing the unusual defect concentration dependence in κ-(BEDT-TTF)2Cu[N(CN)2]Cl are discussed
Original language | English |
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Pages (from-to) | 579-589 |
Number of pages | 11 |
Journal | Crystals |
Volume | 2 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2012 May 24 |
Keywords
- Organic
- Two dimensional
- X-ray irradiation
ASJC Scopus subject areas
- Chemical Engineering(all)
- Materials Science(all)
- Condensed Matter Physics
- Inorganic Chemistry