We investigate the stack structure dependence of magnetic properties on thin films that consist of an antiferromagnetic PtMn and a ferromagnetic Co/Ni multilayer for field-free spin-orbit torque-induced magnetization switching devices. Magnetic parameters, such as the spontaneous magnetization, effective and interfacial magnetic anisotropies, and exchange bias field are quantified as a function of stack structure. Engineering of the stack allows the improvement of current-induced magnetization switching characteristics compared with a previous work, which is confirmed using patterned Hall cross devices.
- artificial neural networks (ANNs)
- exchange bias
- spin-orbit torque (SOT)