Abstract
Light emission spectra from the gap region of a scanning tunneling microscope (STM) have been measured simultaneously with the cross-section of the surface topography. The spectra consist of two components centered about 1.7 and 2.0 eV. The intensity ratio between these components varies as the tip moves along different surface structures on the sample. We have found a correlation between the light emission spectra and the surface topography. We suggest a mechanism that can qualitatively explain the observed position-dependent spectra.
Original language | English |
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Pages (from-to) | 282-288 |
Number of pages | 7 |
Journal | Surface Science |
Volume | 324 |
Issue number | 2-3 |
DOIs | |
Publication status | Published - 1995 Feb 10 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry