@inproceedings{ef22a78780d7448396cfb5334b9101b7,
title = "Strain distribution in heterolayers with low misfit as revealed by convergent beam illumination methods",
abstract = "Convergent beam electron diffraction (CBED) was applied to the local measurements of lattice parameter across a strained interface with small mismatch. GaAs layers grown at low temperature with excess As (with 0.15% misfit) on a GaAs substrate were chosen for these studies. Tetragonal distortion was detected in the layer up to 0.5 μm from the interface. With an increase of the layer thickness lowering of the symmetry of these CBED patterns was observed. This lowering of symmetry is most probably due to saturation of As solubility and the strain build into these layers.",
author = "Zuzanna Liliental-Weber and T. Kaneyama and M. Terauchi and M. Tanaka",
year = "1993",
month = dec,
day = "1",
language = "English",
isbn = "1558991751",
series = "Materials Research Society Symposium Proceedings",
publisher = "Publ by Materials Research Society",
pages = "421--424",
editor = "Atwater, {Harry A.} and Eric Chason and Grabow, {Marcia H.} and Lagally, {Max G.}",
booktitle = "Evolution of Surface and Thin Film Microstructure",
note = "Proceedings of the 1992 Fall Meeting of the Materials Research Society ; Conference date: 30-11-1992 Through 04-12-1992",
}